An on-chip monitor for statistically significant circuit aging characterization
John Keane; Wei Zhang; Chris H. Kim · 2010
WASTE classifies this as Negative / Null Result Report · AI classification, approximate
The study found no significant effect — useful as a negative control or null benchmark for your own design.
Abstract (excerpt)
We present an array-based system to accurately study variations in ROSC aging. Microsecond measurements for minimal BTI recovery, and frequency shift measurement resolution ranging down to the error floor of 0.07% are achieved with three…
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Metadata source: OpenAlex · DOI 10.1109/iedm.2010.5703293